TEM Detector

During TEM operation, the sample is bombarded with high energy electrons. In certain modes of operation (e.g. low magnification, diffraction, grid travers, etc.) similarly high energy X-rays can be formed. When these create too large of an energy flux for a detector, the SiLi crystal and electronic components can be damaged. A common solution to protecting detectors in TEMs has been to use a shutter. This provides protection for the detector but requires an increased distance between the sample and detector to accommodate opening and closing of the shutter.