LEXS

The LEXS is optimized for low energy microanalysis by utilizing the unique parallel beam high collection optics (HCO).В The HCO enables the LEXS to capture the highest countrates of any WDS system available, providing rapid X-ray analysis at the best resolutions obtainable. The LEXS is the first X-ray spectrometer to be specifically designed for low energy X-ray microanalysis, providing high count rates and Peak-to-Background ratios and better the 20eV energy resolution for X-ray energies below 2.5keV. The LEXS is ideal for resolving such overlaps as Si KО± from W or Ta MО± and N KО± from Ti LО±, with count ratesВ sufficiently high enough so that speed of analysis is not a constraint of the system.В Although the upper energy limit of the LEXS is 2.4 keV the spectrometer is able to measure the higher atomic number elements such as Cr, Fe and Cu using their M lines.В